Preparation and characterization of 33S samples for 33S(n, α)30Si cross-section measurements at the n_TOF facility at CERN

Praena, J. and Bosnar, Damir and Žugec, Petar (n_TOF Collaboration) (2018) Preparation and characterization of 33S samples for 33S(n, α)30Si cross-section measurements at the n_TOF facility at CERN. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 890. pp. 142-147. ISSN 0168-9002

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Abstract

Thin 33S samples for the study of the 33S(n, α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.

Item Type: Article
Keywords: neutron induced alpha emission, thermal evaporation, Rutherford backscattering
Date: 2018
Subjects: NATURAL SCIENCES > Physics
Additional Information: /© 2018 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). Received 4 January 2018; Received in revised form 31 January 2018; Accepted 12 February 2018 ; Available online 15 February 2018.
Divisions: Faculty of Science > Department of Physics
Publisher: Elsevier
Depositing User: Gordana Stubičan Ladešić
Date Deposited: 03 Apr 2018 11:02
Last Modified: 03 Apr 2018 11:02
URI: http://digre.pmf.unizg.hr/id/eprint/5810

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